MILPITAS, Calif., Jan. 27, 2014 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (Nasdaq:NANO), a leading provider of advanced process control metrology and inspection systems, today announced that Dr. Timothy Stultz, president and chief executive officer, is scheduled to present at the Stifel 2014 Technology, Internet & Media Conference.
The conference will be held at the Fairmont Hotel in San Francisco, CA from February 10-12, 2014. Nanometrics is scheduled to present on Monday, February 10 at 1:00 PM PT.
The presentation material, along with a live audio webcast and archived recording of the presentation, will be made available on Nanometrics' website at www.nanometrics.com.
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, such as data storage components and discretes including high-brightness LEDs and power management components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor market. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.