MILPITAS, Calif., July 22, 2014 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (Nasdaq:NANO), a leading provider of advanced process control metrology and inspection systems, today announced the company's participation in the following investor events:
Pacific Crest 16th Annual Global Technology Leadership Forum
Sonnenalp Resort, Vail, CO
Event dates: August 10-13, 2014
Presentation time: August 11 at 9:00 AM MDT
Canaccord Genuity 34th Annual Growth Conference
Intercontinental Hotel, Boston, MA
Event dates: August 13-14, 2014
Presentation time: August 13 at 3:30 PM EDT
The presentation material utilized at both events, along with a live audio webcast and archived recording of the Canaccord Genuity conference presentation, will be made available on Nanometrics' website at www.nanometrics.com.
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, such as data storage components and discretes including high-brightness LEDs and power management components. Nanometrics' automated and integrated metrology systems measure critical dimensions, device structures, overlay registration, topography and various thin film properties, including film thickness as well as optical, electrical and material properties. The company's process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced wafer-scale packaging applications. Nanometrics' systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor market. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics' website is http://www.nanometrics.com.