MILPITAS, Calif., May 10, 2016 (GLOBE NEWSWIRE) -- Nanometrics Incorporated (Nasdaq:NANO), a leading provider of advanced process control systems, today announced their participation in the following investor events:
D.A. Davidson & Co. 8th Annual Technology Forum
The Roosevelt Hotel, New York, NY
June 1, 2016
Benchmark Company, LLC One-on-One Investor Conference
The Pfister Hotel, Milwaukee, WI
June 2, 2016
Stifel 2016 Technology, Internet & Media Conference
The Fairmont Hotel, San Francisco, CA
June 6-7, 2016
Presentation Time: 3:00 – 3:30 PM PT on June 6
Presentation materials utilized at each event, along with a live and archived webcast of the Stifel presentation on June 6, will be made available on Nanometrics' website at www.nanometrics.com.
Nanometrics is a leading provider of advanced, high-performance process control metrology and inspection systems used primarily in the fabrication of semiconductors and other solid-state devices, including sensors, optoelectronic devices, high-brightness LEDs, discretes and data storage components. Nanometrics’ automated and integrated metrology systems measure critical dimensions, device structures, topography and various thin film properties, including three-dimensional features and film thickness, as well as optical, electrical and material properties. The company’s process control solutions are deployed throughout the fabrication process, from front-end-of-line substrate manufacturing, to high-volume production of semiconductors and other devices, to advanced three-dimensional wafer-level packaging applications. Nanometrics’ systems enable advanced process control for device manufacturers, providing improved device yield at reduced manufacturing cycle time, supporting the accelerated product life cycles in the semiconductor and other advanced device markets. The company maintains its headquarters in Milpitas, California, with sales and service offices worldwide. Nanometrics is traded on NASDAQ Global Select Market under the symbol NANO. Nanometrics’ website is http://www.nanometrics.com.