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FEI Launches Helios G4 DualBeam Series for Materials Science

HILLSBORO, Ore., June 27, 2016 (GLOBE NEWSWIRE) -- FEI (NASDAQ:FEIC) continues to lead the industry with the launch of the Helios™ G4 DualBeam Series for materials science, offering highly automated and precise sample preparation for transmission electron microscopy (TEM) and three-dimensional (3D) sample characterization. The Helios G4 features FEI’s most advanced scanning electron microscope (SEM) and focused ion beam (FIB) technology with a new level of automation and ease-of-use.

“We are pleased to announce this flagship DualBeam family, which brings a higher level of performance to our materials science customers. The Helios G4 is equipped with new technology to help materials scientists obtain the highest quality subsurface and 3D information at the nanometer scale. The DualBeam’s new guided TEM sample preparation workflow enables even novice users to quickly and easily prepare high-quality, ultra-thin samples for S/TEM imaging,” states Trisha Rice, vice president and general manager of FEI’s Materials Science Business.

The Helios G4 offers many innovative enhancements. Some of the most significant include:

  • FEI’s latest and most precise Phoenix FIB column, with industry leading low-voltage performance for ultra-low sample damage,
  • FEI’s high-resolution Elstar electron column, with the new UC+ technology that offers 4x more monochromated current than the previous generation,
  • Auto Slice & View 4.0 software for unattended FIB nanotomography and a semi-automated workflow for TEM sample preparation, both of which provide high quality results, faster and easier than ever before.

The Helios G4 DualBeam Series also includes the FX model -- a flexible system that delivers dramatic sub-three Ångström STEM resolution. The FX model combines high-resolution imaging and sample preparation on one system, so results can be obtained within minutes of completing the lamella without removing the sample from vacuum, rather than the hours or days required previously to finalize the images on a stand-alone S/TEM system.

“The unique combination of new column technology, software and control electronics helps to support advanced materials characterization,” adds Rice. “The Helios G4 provides essential data to multi-scale, multimodal workflows, giving scientists the ability to locate and obtain information quickly and easily. These novel product enhancements continue to differentiate FEI’s flagship DualBeam Series from all other FIB/SEM solutions on the market.”

For more information about FEI’s Helios G4 DualBeam Series, please visit http://www.fei.com/products/dualbeam/helios-nanolab/.

About FEI
FEI Company (Nasdaq:FEIC) designs, manufactures and supports a broad range of high-performance microscopy workflow solutions that provide images and answers at the micro-, nano- and picometer scales. Its innovation and leadership enable customers in industry and science to increase productivity and make breakthrough discoveries. Headquartered in Hillsboro, Ore., USA, FEI has over 2,800 employees and sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.

FEI Safe Harbor Statement
This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the Helios G4 DualBeam Series. Factors that could affect these forward-looking statements include but are not limited to our ability to manufacture, ship, deliver and install the tools, solutions or software as expected; failure of the product or technology to perform as expected; unexpected technology problems and challenges; changes to the technology; the inability of FEI, its suppliers or project partners to make the technological advances required for the technology to achieve anticipated results; and the inability of the customer to deploy the tools or develop and deploy the expected new applications. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.

For more information contact: Sandy Fewkes (media contact) MindWrite Communications, Inc. +1 408 224 4024 sandy@mind-write.com FEI Jason Willey (investors and analysts) Sr. Director, Investor Relations & Corporate Development +1 503 726 2533 jason.willey@fei.com

Source:FEI Company