FREMONT, Calif., July 26, 2016 (GLOBE NEWSWIRE) -- Aehr Test Systems (NASDAQ:AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced that it has shipped the initial FOX-1P system, its next generation single wafer test system for high volume production and early failure rate (EFR) test, to the initial lead customer for this system.
Gayn Erickson, President and CEO of Aehr Test Systems, commented, “We are very excited to have shipped this initial FOX-1P test system to the customer that we partnered with on its development. Our team did an outstanding job in successfully completing the NRE milestones and we are pleased with its functionality and performance. Due to the thorough pre-shipment qualification testing with the customer, we expect a smooth acceptance at the customer's site. Shipment of the multiple follow-on production systems already in backlog and in final integration and test on our manufacturing floor is expected within the next quarter.
“We believe the FOX-1P System, with more than 16,000 Universal Channels, provides more test resources than any other automated test equipment system on the market. This enables a single touchdown test of many of the most complex wafers. We see this system as highly differentiated from competitive alternatives for non-volatile memory wafer test and also for testing embedded memories and microcontrollers. Our new FOX-1P system is well positioned to address emerging test challenges by lowering the cost of test, especially for devices using Design for Test (DFT) methodologies, and we believe the FOX-1P system will significantly expand our served available market moving forward.”
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a worldwide provider of test systems for burning-in and testing logic and memory integrated circuits and has an installed base of more than 2,500 systems worldwide. Increased quality and reliability needs of the Automotive and Mobility integrated circuit markets are driving additional test requirements, capacity needs and opportunities for Aehr Test products in package and wafer level test. Aehr Test has developed and introduced several innovative products, including the ABTS™ and FOX families of test and burn-in systems and WaferPak contactors. The ABTS systems are used in production and qualification testing of packaged parts for both low-power and high-power logic as well as memory devices. The FOX family of systems includes single and multi-wafer full wafer contact test and burn-in systems used for burn-in and functional test of complex devices, such as leading-edge memories, digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The WaferPak contactor contains a unique full wafer probe card capable of testing wafers up to 300mm that enables IC manufacturers to perform test and burn-in of full wafers on Aehr Test FOX systems. For more information, please visit Aehr Test’s website at www.aehr.com.
Safe Harbor Statement
This press release contains certain forward-looking statements based on current expectations, forecasts and assumptions that involve risks and uncertainties. These statements are based on information available to Aehr Test as of the date hereof and actual results could differ materially from those stated or implied due to risks and uncertainties. Forward-looking statements include statements regarding Aehr Test's expectations, beliefs, intentions or strategies regarding the FOX products, including statements regarding future market opportunities and conditions, expected product shipment dates and customer orders or commitments. These risks and uncertainties include, without limitation, acceptance by customers of the FOX-1P system and the ability of new products to meet customer needs or perform as described, as well as general market conditions, customer demand and acceptance of Aehr Test’s products and Aehr Test’s ability to execute on its business strategy. See Aehr Test’s recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission for a more detailed description of the risks facing Aehr Test’s business. Aehr Test disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.
Aehr Test Systems Carl Buck Vice President of Marketing (510) 623-9400 x309 Investor Relations Contact: Todd Kehrli or Jim Byers MKR Group, Inc. (323) 468-2300 email@example.com
Source:Aehr Test Systems