HILLSBORO, Ore., Nov. 5, 2012 (GLOBE NEWSWIRE) -- FEI (Nasdaq:FEIC) today announced the release of MLA EXpress™, a low-cost, bench-top, automated mineralogy analyzer that may enable the mining industry to maximize the recovery of valuable metals from the ore. MLA EXpress extends mineral liberation analysis to a broader scale of mining operations. Shipment of the first systems is scheduled for Q1 2013.
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"Mine geologists and metallurgists are challenged to determine metal recovery potential from grade information alone," stated Paul Scagnetti, FEI's Natural Resources vice president and general manager. "Once the ore is on the conveyor belt, they are further challenged to optimize processing methods and sequence to maximize the recovery of valuable metals from the ore. And if recovery should drop, they must quickly discover the cause of the recovery excursion and recommend appropriate corrective action. MLA EXpress gives them the graphic, mineralogical and textural information from the ore they need to make the best decisions at a cost that is affordable for smaller operations."
Automated mineralogy involves a scanning electron microscope (SEM) and x-ray spectrometer to obtain a microscopic view of structure and composition of an ore. The MLA EXpress is well-suited for typical mining operational environments; the simple design requires no special operational skills. Multiple analytical modes enable the flexibility to accommodate a variety of ore types and analysis requirements. Special detector and pulse counting technologies enable extremely high count rates for fast, precise analytical results. Most importantly, the low price and low operating costs of the MLA EXpress make it a cost-effective solution for a broad range of mining operations.
For more information, please visit: www.fei-natural-resources.com or contact your local FEI representative.
FEI (Nasdaq:FEIC) is a leading diversified scientific instruments company. It is a premier provider of electron- and ion-beam microscopes and solutions for nanoscale applications across many industries: industrial and academic materials research, life sciences, semiconductors, data storage, natural resources and more. With more than 60 years of technological innovation and leadership, FEI has set the performance standard in transmission electron microscopes (TEM), scanning electron microscopes (SEM) and DualBeams™, which combine a SEM with a focused ion beam (FIB). Headquartered in Hillsboro, Ore., USA, FEI has over 2,300 employees and sales and service operations in more than 50 countries around the world. More information can be found at: www.fei.com.
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FEI Safe Harbor Statement
This news release contains forward-looking statements that include statements regarding the performance capabilities and benefits of the MLA EXpress system. Factors that could affect these forward-looking statements include but are not limited to failure of the product or technology to perform as expected and achieve anticipated results, unexpected technology problems and challenges, changes to the technology, the inability of FEI, its suppliers or project partners to make the technological advances required for the technology to achieve anticipated results, the inability of customers to develop and deploy the expected new applications and our ability to manufacture, ship and deliver the tools or software as expected. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other filings with the U.S. Securities and Exchange Commission for additional information on these factors and other factors that could cause actual results to differ materially from the forward-looking statements. FEI assumes no duty to update forward-looking statements.
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